Collaborative Distributed Machine Learning
Jin, D.; Kannengießer, N.; Rank, S.; Sunyaev, A.
2024. ACM Computing Surveys.
Research at KASTEL Security Research Labs is distinguished by its broad scope. Privacy and reliability aspects are naturally part of IT security; basic and applied research complement each other, and a comprehensive approach to IT security needs to look not just at the technical system, but also at its social environment as well as its human aspects.
Our research covers a broad spectrum of cybersecurity. It combines the view of different disciplines in order to adress not only technical aspects, but also human factors and the legal framework.
KASTEL Security Research Labs conduct interdisciplinary and application-oriented research. Therefore, we permanently maintain and expand numerous partnerships with industrial enterprises and research institutions. The resulting synergy effects flow into our research.
Jin, D.; Kannengießer, N.; Rank, S.; Sunyaev, A.
2024. ACM Computing Surveys.
Hanisch, S.; Pogrzeba, L.; Muschter, E.; Li, S.-C.; Strufe, T.
2024. Scientific Data, 11 (1), Art.-Nr.: 1209.
Weber, T.; Ojha, M.; Sadeghi, M.; König, L.; Armbruster, M.; Lange, A.; Burger, E.; Atkinson, C.
2024. Proceedings of the ACM/IEEE 27th International Conference on Model Driven Engineering Languages and Systems, Linz Austria, 22nd – 27th September 2024, 760–769, Association for Computing Machinery (ACM).
Frank, K.; Mengesdorf, T.; Radić, M.; Herrmann, P.; Appenzeller, A.; Mucha, H.; Orak, B.; Spiecker gen. Döhmann, I.; Rüping, S.; Burkhardt, H.; Köhm, M.; Dauth, S.
2024. Healthcare, 12 (20), Art.-Nr.: 2053.
Khaloopour, L.; Su, Y.; Raskob, F.; Meuser, T.; Bless, R.; Janzen, L.; Abedi, K.; Andjelkovic, M.; Chaari, H.; Chakraborty, P.; Kreutzer, M.; Hollick, M.; Strufe, T.; Franchi, N.; Jamali, V.
2023. IEEE Access, 11.
Krack, T.; Kopmann, S.; Zitterbart, M.
2024. 2024 IEEE 49th Conference on Local Computer Networks (LCN), Normandy, France, 08-10 October 2024, Institute of Electrical and Electronics Engineers (IEEE).